Development Of Variable Sampling Interval Run Sum T Chart And Triple Sampling X ̅ Chart With Estimated Process Parameters

The Shewhart x ̅ control chart is a useful chart in process monitoring. However, the Shewhart x ̅ chart’s performance is significantly affected if the process standard deviation is erroneously estimated. To circumvent this problem, the t chart is commonly used as an alternative to the Shewhart x ̅ chart. The first and second objectives of this thesis aim at enhancing the performance of the basic t chart by proposing the variable sampling interval run sum (VSI RS) t charts for monitoring the mean of a process from a normal distribution, based on known and estimated process mean, respectively. The Markov chain technique is used to compute the optimal parameters for the new charts

Revised Triple Sampling X Control Charts for the Mean with Known and Estimated Process Parameters

International audienc